Christensen, Jesper B. ; Jørgensen, Asbjørn A. ; Vandborg, Mads H. ; Thomas, Peter J. ; Lu, Xin ; Failleau, Guillaume ; Eisermann, René ; Grüner-Nielsen, Lars ; Balslev-Harder, David ; Lassen, Mikael ; Krenek, Stephan
in: Optics Express, vol: 32, issue: 26, pages: 45483-45493
Type: Journal article (Peer reviewed)
Status:
Published
| Year:
2024
| DOI:
https://doi.org/10.1364/OE.544659